# this file is part of refractiveindex.info database
# refractiveindex.info database is in the public domain
# copyright and related rights waived via CC0 1.0

REFERENCES: |
    L. W. Perner, G.-W. Truong, D. Follman, M. Prinz, G. Winkler, S. Puchegger, G. D. Cole, O. H. Heckl.
    Simultaneous measurement of mid-infrared refractive indices in thin-film heterostructures: Methodology and results for GaAs/AlGaAs.
    <a href="https://doi.org/10.1103/PhysRevResearch.5.033048"><i>Phys. Rev. Res.</i> <b>5</b>, 033048 (2023)</a>
    (Data kindly provided by the authors)
COMMENTS: |
    Al<sub>0.929</sub>Ga<sub>0.071</sub>As (interpolation for other alloy ratios possible). Relative standard uncertainty ≤3.3×10<sup>-4</sup> over whole range. Measured in a high-purity GaAs/AlGaAs crystalline thin-film multilayer. Sample grown via molecular beam epitaxy on GaAs seed wafer. Optical measurements at 2.21 mbar and 22 °C.
DATA:
  - type: formula 1
    wavelength_range: 2.0 7.1
    coefficients: 0 7.214199525964231 0.26714974883257975
CONDITIONS:
    temperature: 295